\begin{thebibliography}{}

\bibitem[\protect\citeauthoryear{Arisholm and Briand}{Arisholm and
  Briand}{2006}]{arisholm06}
{\sc Arisholm, E.} {\sc and} {\sc Briand, L.} 2006.
\newblock Predicting fault-prone components in a java legacy system.
\newblock In {\em 5th ACM-IEEE International Symposium on Empirical Software
  Engineering (ISESE), Rio de Janeiro, Brazil, September 21-22}.
\newblock Available from
  \url{http://simula.no/research/engineering/publications/Arisholm.2006.4}.

\bibitem[\protect\citeauthoryear{Ayse~Tosun1}{Ayse~Tosun1}{2010}]{tosun10}
{\sc Ayse~Tosun1, Ayse~Bener2, R.~K.} 2010.
\newblock Ai-based software defect predictors: Applications and benefits in a
  case study.
\newblock In {\em IAAI'10}.

\bibitem[\protect\citeauthoryear{Blake and Merz}{Blake and
  Merz}{1998}]{Blake+Merz:1998}
{\sc Blake, C.} {\sc and} {\sc Merz, C.} 1998.
\newblock {UCI} repository of machine learning databases.
\newblock URL: \url{http://www.ics.uci.edu/~mlearn/MLRepository.html}.

\bibitem[\protect\citeauthoryear{Bradley, Fayyad, and Reina}{Bradley
  et~al\mbox{.}}{1998}]{bradley98scaling}
{\sc Bradley, P.~S.}, {\sc Fayyad, U.~M.}, {\sc and} {\sc Reina, C.} 1998.
\newblock Scaling clustering algorithms to large databases.
\newblock In {\em Knowledge Discovery and Data Mining}. 9--15.
\newblock Available from
  \url{http://citeseer.ist.psu.edu/bradley98scaling.html}.

\bibitem[\protect\citeauthoryear{Breiman, Friedman, Olshen, and Stone}{Breiman
  et~al\mbox{.}}{1984}]{breiman84}
{\sc Breiman, L.}, {\sc Friedman, J.~H.}, {\sc Olshen, R.~A.}, {\sc and} {\sc
  Stone, C.~J.} 1984.
\newblock Classification and regression trees.
\newblock Tech. rep., Wadsworth International, Monterey, CA.

\bibitem[\protect\citeauthoryear{Breimann}{Breimann}{2001}]{briemann01}
{\sc Breimann, L.} 2001.
\newblock Random forests.
\newblock {\em Machine Learning\/}, 5--32.

\bibitem[\protect\citeauthoryear{Brieman}{Brieman}{1996}]{brieman96}
{\sc Brieman, L.} 1996.
\newblock Bagging predictors.
\newblock {\em Machine Learning\/}~{\em 24,\/}~2, 123--140.

\bibitem[\protect\citeauthoryear{Chapman and Solomon}{Chapman and
  Solomon}{2002}]{chapman02}
{\sc Chapman, M.} {\sc and} {\sc Solomon, D.} 2002.
\newblock The relationship of cyclomatic complexity, essential complexity and
  error rates.
\newblock Proceedings of the NASA Software Assurance Symposium, Coolfont Resort
  and Conference Center in Berkley Springs, West Virginia. Available from
  \url{http://www.ivv.nasa.gov/business/research/osmasas/conclusion2002/Mike_C%
hapman_The_Relationship_of_Cyclomatic_Complexity_Essential_Complexity_and_Erro%
r_Rates.ppt}.

\bibitem[\protect\citeauthoryear{Cohen}{Cohen}{1995a}]{cohen95}
{\sc Cohen, P.} 1995a.
\newblock {\em Empirical Methods for Artificial Intelligence}.
\newblock MIT Press.

\bibitem[\protect\citeauthoryear{Cohen}{Cohen}{1995b}]{cohen95r}
{\sc Cohen, W.} 1995b.
\newblock Fast effective rule induction.
\newblock In {\em ICML'95}. 115--123.
\newblock Available on-line from
  \url{http://www.cs.cmu.edu/~wcohen/postscript/ml-95-ripper.ps}.

\bibitem[\protect\citeauthoryear{Cover and Hart}{Cover and
  Hart}{1967}]{cover67}
{\sc Cover, T.~M.} {\sc and} {\sc Hart, P.~E.} 1967.
\newblock Nearest neighbour pattern classification.
\newblock {\em IEEE Transactions on Information Theory\/}, 21--27.

\bibitem[\protect\citeauthoryear{Demsar}{Demsar}{2006}]{demsar06}
{\sc Demsar, J.} 2006.
\newblock Statistical comparisons of clasifiers over multiple data sets.
\newblock {\em Journal of Machine Learning Research\/}~{\em 7}, 1--30.
\newblock Avaliable from
  \url{http://jmlr.csail.mit.edu/papers/v7/demsar06a.html}.

\bibitem[\protect\citeauthoryear{Dietterich}{Dietterich}{1997}]{dietterich97}
{\sc Dietterich, T.} 1997.
\newblock Machine learning research: Four current directions.
\newblock {\em AI Magazine\/}~{\em 18,\/}~4, 97--136.

\bibitem[\protect\citeauthoryear{Domingos and Pazzani}{Domingos and
  Pazzani}{1997}]{domingos97optimality}
{\sc Domingos, P.} {\sc and} {\sc Pazzani, M.~J.} 1997.
\newblock On the optimality of the simple bayesian classifier under zero-one
  loss.
\newblock {\em Machine Learning\/}~{\em 29,\/}~2-3, 103--130.

\bibitem[\protect\citeauthoryear{Elkan}{Elkan}{2001}]{elkan01}
{\sc Elkan, C.} 2001.
\newblock The foundations of cost-sensitive learning.
\newblock In {\em Proceedings of the Seventeenth International Joint Conference
  on Artificial Intelligence (IJCAI’01)}.
\newblock Available from \url{http://www-cse.ucsd.edu/users/elkan/rescale.pdf}.

\bibitem[\protect\citeauthoryear{Fagan}{Fagan}{1976}]{fagan76}
{\sc Fagan, M.} 1976.
\newblock Design and code inspections to reduce errors in program development.
\newblock {\em IBM Systems Journal\/}~{\em 15,\/}~3.

\bibitem[\protect\citeauthoryear{Fagan}{Fagan}{1986}]{fagan86}
{\sc Fagan, M.} 1986.
\newblock Advances in software inspections.
\newblock {\em IEEE Trans. on Software Engineering\/}, 744--751.

\bibitem[\protect\citeauthoryear{Fawcett}{Fawcett}{2001}]{fawcett01}
{\sc Fawcett, T.} 2001.
\newblock Using rule sets to maximize roc performance.
\newblock In {\em 2001 IEEE International Conference on Data Mining (ICDM-01)}.
\newblock Available from
  \url{http://home.comcast.net/~tom.fawcett/public_html/papers/ICDM-final.pdf}.

\bibitem[\protect\citeauthoryear{Fenton, Pfleeger, and Glass}{Fenton
  et~al\mbox{.}}{1994}]{fenton94}
{\sc Fenton, N.}, {\sc Pfleeger, S.}, {\sc and} {\sc Glass, R.} 1994.
\newblock Science and {S}ubstance: A {C}hallenge to {S}oftware {E}ngineers.
\newblock {\em IEEE Software\/}, 86--95.

\bibitem[\protect\citeauthoryear{Fenton and Neil}{Fenton and
  Neil}{1999}]{fenton99}
{\sc Fenton, N.~E.} {\sc and} {\sc Neil, M.} 1999.
\newblock A critique of software defect prediction models.
\newblock {\em IEEE Transactions on Software Engineering\/}~{\em 25,\/}~5,
  675--689.
\newblock Available from
  \url{http://citeseer.nj.nec.com/fenton99critique.html}.

\bibitem[\protect\citeauthoryear{Fenton and Pfleeger}{Fenton and
  Pfleeger}{1995}]{fenton96}
{\sc Fenton, N.~E.} {\sc and} {\sc Pfleeger, S.} 1995.
\newblock {\em Software Metrics: A Rigorous \& Practical Approach (second
  edition)}.
\newblock International Thompson Press.

\bibitem[\protect\citeauthoryear{Fenton and Pfleeger}{Fenton and
  Pfleeger}{1997}]{fenton97}
{\sc Fenton, N.~E.} {\sc and} {\sc Pfleeger, S.} 1997.
\newblock {\em Software Metrics: A Rigorous \& Practical Approach}.
\newblock International Thompson Press.

\bibitem[\protect\citeauthoryear{Freund and Schapire}{Freund and
  Schapire}{1997}]{FreSch97}
{\sc Freund, Y.} {\sc and} {\sc Schapire, R.} 1997.
\newblock A decision-theoretic generalization of on-line learning and an
  application to boosting.
\newblock {\em JCSS: Journal of Computer and System Sciences\/}~{\em 55}.

\bibitem[\protect\citeauthoryear{Hall and Munson}{Hall and
  Munson}{2000}]{hall00}
{\sc Hall, G.} {\sc and} {\sc Munson, J.} 2000.
\newblock Software evolution: code delta and code churn.
\newblock {\em Journal of Systems and Software\/}, 111 -- 118.

\bibitem[\protect\citeauthoryear{Halstead}{Halstead}{1977}]{halstead77}
{\sc Halstead, M.} 1977.
\newblock {\em Elements of Software Science}.
\newblock Elsevier.

\bibitem[\protect\citeauthoryear{Huang and Ling}{Huang and
  Ling}{2005}]{huang05}
{\sc Huang, J.} {\sc and} {\sc Ling, C.} 2005.
\newblock Using auc and accuracy in evaluating learning algorithms.
\newblock {\em IEEE Transactions on Knowledge and Data Engineering\/}~{\em
  17,\/}~3 (March), 299--310.

\bibitem[\protect\citeauthoryear{Jiang, Cukic, and Ma}{Jiang
  et~al\mbox{.}}{2008}]{jiang08b}
{\sc Jiang, Y.}, {\sc Cukic, B.}, {\sc and} {\sc Ma, Y.} 2008.
\newblock Techniques for evaluating fault prediction models.
\newblock {\em Empirical Software Engineering\/}, 561--595.

\bibitem[\protect\citeauthoryear{Jiang, Cukic, and Menzies}{Jiang
  et~al\mbox{.}}{2008}]{jiang08a}
{\sc Jiang, Y.}, {\sc Cukic, B.}, {\sc and} {\sc Menzies, T.} 2008.
\newblock Does transformation help?
\newblock In {\em Defects 2008}.
\newblock Available from \url{http://menzies.us/pdf/08transform.pdf}.

\bibitem[\protect\citeauthoryear{Khoshgoftaar}{Khoshgoftaar}{2001}]{khoshgofta%
ar01}
{\sc Khoshgoftaar, T.} 2001.
\newblock An application of zero-inflated poisson regression for software fault
  prediction.
\newblock In {\em Proceedings of the 12th International Symposium on Software
  Reliability Engineering, Hong Kong}. 66--73.

\bibitem[\protect\citeauthoryear{Khoshgoftaar and Allen}{Khoshgoftaar and
  Allen}{2001}]{khoshgoftaar99}
{\sc Khoshgoftaar, T.} {\sc and} {\sc Allen, E.} 2001.
\newblock Model software quality with classification trees.
\newblock In {\em Recent Advances in Reliability and Quality Engineering},
  {H.~Pham}, Ed. World Scientific, 247--270.

\bibitem[\protect\citeauthoryear{Khoshgoftaar and Seliya}{Khoshgoftaar and
  Seliya}{2003}]{journals/ese/KhoshgoftaarS03}
{\sc Khoshgoftaar, T.~M.} {\sc and} {\sc Seliya, N.} 2003.
\newblock Fault prediction modeling for software quality estimation: Comparing
  commonly used techniques.
\newblock {\em Empirical Software Engineering\/}~{\em 8,\/}~3, 255--283.

\bibitem[\protect\citeauthoryear{Koru, Emam, Zhang, Liu, and Mathew}{Koru
  et~al\mbox{.}}{2008}]{koru08}
{\sc Koru, A.}, {\sc Emam, K.~E.}, {\sc Zhang, D.}, {\sc Liu, H.}, {\sc and}
  {\sc Mathew, D.} 2008.
\newblock Theory of relative defect proneness: Replicated studies on the
  functional form of the size-defect relationship.
\newblock {\em Empirical Software Engineering\/}, 473--498.

\bibitem[\protect\citeauthoryear{Koru, Zhang, El~Emam, and Liu}{Koru
  et~al\mbox{.}}{2009}]{koru09}
{\sc Koru, A.}, {\sc Zhang, D.}, {\sc El~Emam, K.}, {\sc and} {\sc Liu, H.}
  2009.
\newblock An investigation into the functional form of the size-defect
  relationship for software modules.
\newblock {\em Software Engineering, IEEE Transactions on\/}~{\em 35,\/}~2
  (March-April), 293 --304.

\bibitem[\protect\citeauthoryear{Koru, Zhang, and Liu}{Koru
  et~al\mbox{.}}{2007}]{koru07}
{\sc Koru, A.}, {\sc Zhang, D.}, {\sc and} {\sc Liu, H.} 2007.
\newblock Modeling the effect of size on defect proneness for open-source
  software.
\newblock In {\em Proceceedings PROMISE'07 (ICSE)}.
\newblock Available from
  \url{http://promisedata.org/pdf/mpls2007KoruZhangLiu.pdf}.

\bibitem[\protect\citeauthoryear{Lessmann, Baesens, Mues, and Pietsch}{Lessmann
  et~al\mbox{.}}{2008}]{lessmann09}
{\sc Lessmann, S.}, {\sc Baesens, B.}, {\sc Mues, C.}, {\sc and} {\sc Pietsch,
  S.} 2008.
\newblock Benchmarking classification models for software defect prediction: A
  proposed framework and novel findings.
\newblock {\em IEEE Transactions on Software Engineering\/}.

\bibitem[\protect\citeauthoryear{Leveson}{Leveson}{1995}]{leven95}
{\sc Leveson, N.} 1995.
\newblock {\em Safeware System Safety And Computers}.
\newblock Addison-Wesley.

\bibitem[\protect\citeauthoryear{Littlewood and Wright}{Littlewood and
  Wright}{1997}]{littlewood97}
{\sc Littlewood, B.} {\sc and} {\sc Wright, D.} 1997.
\newblock Some conservative stopping rules for the operational testing of
  safety-critical software.
\newblock {\em IEEE Transactions on Software Engineering\/}~{\em 23,\/}~11
  (November), 673--683.

\bibitem[\protect\citeauthoryear{Lowry, Boyd, and Kulkarni}{Lowry
  et~al\mbox{.}}{1998}]{lowrey98}
{\sc Lowry, M.}, {\sc Boyd, M.}, {\sc and} {\sc Kulkarni, D.} 1998.
\newblock Towards a theory for integration of mathematical verification and
  empirical testing.
\newblock In {\em Proceedings, ASE'98: Automated Software Engineering}.
  322--331.

\bibitem[\protect\citeauthoryear{Lutz and Mikulski}{Lutz and
  Mikulski}{2003}]{lutz03}
{\sc Lutz, R.} {\sc and} {\sc Mikulski, C.} 2003.
\newblock Operational anomalies as a cause of safety-critical requirements
  evolution.
\newblock {\em Journal of Systems and Software\/}.
\newblock Available from
  \url{http://www.cs.iastate.edu/~rlutz/publications/JSS02.ps}.

\bibitem[\protect\citeauthoryear{McCabe}{McCabe}{1976}]{mccabe76}
{\sc McCabe, T.} 1976.
\newblock A complexity measure.
\newblock {\em IEEE Transactions on Software Engineering\/}~{\em 2,\/}~4
  (Dec.), 308--320.

\bibitem[\protect\citeauthoryear{Menzies and Cukic}{Menzies and
  Cukic}{2000}]{me99q}
{\sc Menzies, T.} {\sc and} {\sc Cukic, B.} 2000.
\newblock When to test less.
\newblock {\em IEEE Software\/}~{\em 17,\/}~5, 107--112.
\newblock Available from \url{http://menzies.us/pdf/00iesoft.pdf}.

\bibitem[\protect\citeauthoryear{Menzies, Dekhtyar, Distefano, and
  Greenwald}{Menzies et~al\mbox{.}}{2007}]{me07e}
{\sc Menzies, T.}, {\sc Dekhtyar, A.}, {\sc Distefano, J.}, {\sc and} {\sc
  Greenwald, J.} 2007.
\newblock Problems with precision.
\newblock {\em IEEE Transactions on Software Engineering\/}.
\newblock \url{http://menzies.us/pdf/07precision.pdf}.

\bibitem[\protect\citeauthoryear{Menzies, Greenwald, and Frank}{Menzies
  et~al\mbox{.}}{2007}]{me07b}
{\sc Menzies, T.}, {\sc Greenwald, J.}, {\sc and} {\sc Frank, A.} 2007.
\newblock Data mining static code attributes to learn defect predictors.
\newblock {\em IEEE Transactions on Software Engineering\/}.
\newblock Available from \url{http://menzies.us/pdf/06learnPredict.pdf}.

\bibitem[\protect\citeauthoryear{Menzies, Raffo, on~Setamanit, Hu, and
  Tootoonian}{Menzies et~al\mbox{.}}{2002}]{me02f}
{\sc Menzies, T.}, {\sc Raffo, D.}, {\sc on~Setamanit, S.}, {\sc Hu, Y.}, {\sc
  and} {\sc Tootoonian, S.} 2002.
\newblock Model-based tests of truisms.
\newblock In {\em Proceedings of IEEE ASE 2002}.
\newblock Available from \url{http://menzies.us/pdf/02truisms.pdf}.

\bibitem[\protect\citeauthoryear{Menzies and Stefano}{Menzies and
  Stefano}{2003}]{me03q}
{\sc Menzies, T.} {\sc and} {\sc Stefano, J. S.~D.} 2003.
\newblock How good is your blind spot sampling policy?
\newblock In {\em 2004 IEEE Conference on High Assurance Software Engineering}.
\newblock Available from \url{http://menzies.us/pdf/03blind.pdf}.

\bibitem[\protect\citeauthoryear{Milton}{Milton}{2008}]{milton08}
{\sc Milton, Z.} 2008.
\newblock Which rules.
\newblock M.S.\ thesis.

\bibitem[\protect\citeauthoryear{Mockus, Zhang, and Li}{Mockus
  et~al\mbox{.}}{2005}]{mockus05}
{\sc Mockus, A.}, {\sc Zhang, P.}, {\sc and} {\sc Li, P.~L.} 2005.
\newblock Predictors of customer perceived software quality.
\newblock In {\em ICSE '05: Proceedings of the 27th international conference on
  Software engineering}. ACM, New York, NY, USA, 225--233.

\bibitem[\protect\citeauthoryear{Musa, Iannino, and Okumoto}{Musa
  et~al\mbox{.}}{1987}]{musa87}
{\sc Musa, J.}, {\sc Iannino, A.}, {\sc and} {\sc Okumoto, K.} 1987.
\newblock {\em Software Reliability: Measurement, Prediction, Application}.
\newblock McGraw Hill.

\bibitem[\protect\citeauthoryear{Nagappan and Ball}{Nagappan and
  Ball}{2005a}]{nagappan05}
{\sc Nagappan, N.} {\sc and} {\sc Ball, T.} 2005a.
\newblock Static analysis tools as early indicators of pre-release defect
  density.
\newblock In {\em ICSE 2005, St. Louis}.

\bibitem[\protect\citeauthoryear{Nagappan and Ball}{Nagappan and
  Ball}{2005b}]{conf/icse/NagappanB05a}
{\sc Nagappan, N.} {\sc and} {\sc Ball, T.} 2005b.
\newblock Static analysis tools as early indicators of pre-release defect
  density.
\newblock In {\em ICSE}. 580--586.

\bibitem[\protect\citeauthoryear{Nagappan, Murphy, and V}{Nagappan
  et~al\mbox{.}}{2008}]{nach08}
{\sc Nagappan, N.}, {\sc Murphy, B.}, {\sc and} {\sc V, B.} 2008.
\newblock The influence of organizational structure on software quality: An
  empirical case study.
\newblock In {\em ICSE'08}.

\bibitem[\protect\citeauthoryear{Nikora}{Nikora}{2004}]{nikora04}
{\sc Nikora, A.} 2004.
\newblock Personnel communication on the accuracy of severity determinations in
  nasa databases.

\bibitem[\protect\citeauthoryear{Nikora and Munson}{Nikora and
  Munson}{2003}]{nikora03}
{\sc Nikora, A.} {\sc and} {\sc Munson, J.} 2003.
\newblock Developing fault predictors for evolving software systems.
\newblock In {\em Ninth International Software Metrics Symposium (METRICS'03)}.

\bibitem[\protect\citeauthoryear{Ostrand, Weyuker, and Bell}{Ostrand
  et~al\mbox{.}}{2004}]{ostrand04}
{\sc Ostrand, T.~J.}, {\sc Weyuker, E.~J.}, {\sc and} {\sc Bell, R.~M.} 2004.
\newblock Where the bugs are.
\newblock In {\em ISSTA '04: Proceedings of the 2004 ACM SIGSOFT international
  symposium on Software testing and analysis}. ACM, New York, NY, USA, 86--96.

\bibitem[\protect\citeauthoryear{Porter and Selby}{Porter and
  Selby}{1990}]{porter90}
{\sc Porter, A.} {\sc and} {\sc Selby, R.} 1990.
\newblock Empirically guided software development using metric-based
  classification trees.
\newblock {\em IEEE Software\/}, 46--54.

\bibitem[\protect\citeauthoryear{Pugh}{Pugh}{1990}]{pugh90}
{\sc Pugh, W.} 1990.
\newblock Skip lists: a probabilistic alternative to balanced trees.
\newblock {\em Communications of the ACM\/}~{\em 33,\/}~6, 668--676.
\newblock Available from
  \url{ftp://ftp.cs.umd.edu/pub/skipLists/skiplists.pdf}.

\bibitem[\protect\citeauthoryear{Quinlan}{Quinlan}{1992a}]{quinlan92b}
{\sc Quinlan, J.~R.} 1992a.
\newblock Learning with {C}ontinuous {C}lasses.
\newblock In {\em 5th Australian Joint Conference on Artificial Intelligence}.
  343--348.
\newblock Available from
  \url{http://citeseer.nj.nec.com/quinlan92learning.html}.

\bibitem[\protect\citeauthoryear{Quinlan}{Quinlan}{1992b}]{quinlan92}
{\sc Quinlan, R.} 1992b.
\newblock {\em C4.5: Programs for Machine Learning}.
\newblock Morgan Kaufman.
\newblock ISBN: 1558602380.

\bibitem[\protect\citeauthoryear{Raffo}{Raffo}{2005}]{raffo05}
{\sc Raffo, D.} 2005.
\newblock Personnel communication.

\bibitem[\protect\citeauthoryear{Rakitin}{Rakitin}{2001}]{rakitin01}
{\sc Rakitin, S.} 2001.
\newblock {\em Software Verification and Validation for Practitioners and
  Managers, Second Edition}.
\newblock Artech House.

\bibitem[\protect\citeauthoryear{Shepperd and Ince}{Shepperd and
  Ince}{1994}]{shepperd94}
{\sc Shepperd, M.} {\sc and} {\sc Ince, D.} 1994.
\newblock A critique of three metrics.
\newblock {\em The Journal of Systems and Software\/}~{\em 26,\/}~3
  (September), 197--210.

\bibitem[\protect\citeauthoryear{Shull, ad~B.~Boehm, Brown, Costa, Lindvall,
  Port, Rus, Tesoriero, and Zelkowitz}{Shull et~al\mbox{.}}{2002}]{shu02}
{\sc Shull, F.}, {\sc ad~B.~Boehm, V.~B.}, {\sc Brown, A.}, {\sc Costa, P.},
  {\sc Lindvall, M.}, {\sc Port, D.}, {\sc Rus, I.}, {\sc Tesoriero, R.}, {\sc
  and} {\sc Zelkowitz, M.} 2002.
\newblock What we have learned about fighting defects.
\newblock In {\em Proceedings of 8th International Software Metrics Symposium,
  Ottawa, Canada}. 249--258.
\newblock Available from
  \url{http://fc-md.umd.edu/fcmd/Papers/shull_defects.ps}.

\bibitem[\protect\citeauthoryear{Shull, Rus, and Basili}{Shull
  et~al\mbox{.}}{2000}]{shull00a}
{\sc Shull, F.}, {\sc Rus, I.}, {\sc and} {\sc Basili, V.} 2000.
\newblock How perspective-based reading can improve requirements inspections.
\newblock {\em IEEE Computer\/}~{\em 33,\/}~7, 73--79.
\newblock Available from
  \url{http://www.cs.umd.edu/projects/SoftEng/ESEG/papers/82.77.pdf}.

\bibitem[\protect\citeauthoryear{Srinivasan and Fisher}{Srinivasan and
  Fisher}{1995}]{srinivasan95}
{\sc Srinivasan, K.} {\sc and} {\sc Fisher, D.} 1995.
\newblock Machine learning approaches to estimating software development
  effort.
\newblock {\em IEEE Trans. Soft. Eng.\/}, 126--137.

\bibitem[\protect\citeauthoryear{T.~Zimmermann and Murphy}{T.~Zimmermann and
  Murphy}{2009}]{zimmermann09}
{\sc T.~Zimmermann, N.~Nagappan, H. G. E.~G.} {\sc and} {\sc Murphy, B.} 2009.
\newblock Cross-project defect prediction.
\newblock In {\em ESEC/FSE'09}.

\bibitem[\protect\citeauthoryear{Tang and Khoshgoftaar}{Tang and
  Khoshgoftaar}{2004}]{conf/ictai/TangK04}
{\sc Tang, W.} {\sc and} {\sc Khoshgoftaar, T.~M.} 2004.
\newblock Noise identification with the k-means algorithm.
\newblock In {\em ICTAI}. 373--378.

\bibitem[\protect\citeauthoryear{Tian and Zelkowitz}{Tian and
  Zelkowitz}{1995}]{tiang95}
{\sc Tian, J.} {\sc and} {\sc Zelkowitz, M.} 1995.
\newblock Complexity measure evaluation and selection.
\newblock {\em IEEE Transaction on Software Engineering\/}~{\em 21,\/}~8
  (Aug.), 641--649.

\bibitem[\protect\citeauthoryear{Tosun, Bener, and Turhan}{Tosun
  et~al\mbox{.}}{2009}]{tosun09}
{\sc Tosun, A.}, {\sc Bener, A.}, {\sc and} {\sc Turhan, B.} 2009.
\newblock Practical considerations of deploying ai in defect prediction: A case
  study within the turkish telecommunication industry.
\newblock In {\em PROMISE'09}.

\bibitem[\protect\citeauthoryear{Turhan, Menzies, Bener, and Distefano}{Turhan
  et~al\mbox{.}}{2009}]{me09b}
{\sc Turhan, B.}, {\sc Menzies, T.}, {\sc Bener, A.}, {\sc and} {\sc Distefano,
  J.} 2009.
\newblock On the relative value of cross-company and within-company data for
  defect prediction.
\newblock {\em Empirical Software Engineering\/}~{\em 68,\/}~2, 278--290.
\newblock Available from \url{http://menzies.us/pdf/08ccwc.pdf}.

\bibitem[\protect\citeauthoryear{Turner}{Turner}{2006}]{ism06}
{\sc Turner, J.} 2006.
\newblock A predictive approach to eliminating errors in software code.
\newblock Available from
  \url{http://www.sti.nasa.gov/tto/Spinoff2006/ct_1.html}.

\bibitem[\protect\citeauthoryear{Voas and Miller}{Voas and
  Miller}{1995}]{voas95}
{\sc Voas, J.} {\sc and} {\sc Miller, K.} 1995.
\newblock Software testability: The new verification.
\newblock {\em IEEE Software\/}, 17--28.
\newblock Available from
  \url{http://www.cigital.com/papers/download/ieeesoftware95.ps}.

\bibitem[\protect\citeauthoryear{Weyuker, Ostrand, and Bell}{Weyuker
  et~al\mbox{.}}{2008}]{weyeuker08}
{\sc Weyuker, E.}, {\sc Ostrand, T.}, {\sc and} {\sc Bell, R.} 2008.
\newblock Do too many cooks spoil the broth? using the number of developers to
  enhance defect prediction models.
\newblock {\em Empirical Software Engineering\/}.

\bibitem[\protect\citeauthoryear{Witten and Frank}{Witten and
  Frank}{2005}]{witten05}
{\sc Witten, I.~H.} {\sc and} {\sc Frank, E.} 2005.
\newblock {\em Data mining. 2nd edition}.
\newblock Morgan Kaufmann, Los Altos, US.

\bibitem[\protect\citeauthoryear{Yang, Webb, Cerquides, Korb, Boughton, and
  Ting}{Yang et~al\mbox{.}}{2006}]{yang06}
{\sc Yang, Y.}, {\sc Webb, G.~I.}, {\sc Cerquides, J.}, {\sc Korb, K.~B.}, {\sc
  Boughton, J.~R.}, {\sc and} {\sc Ting, K.~M.} 2006.
\newblock To select or to weigh: A comparative study of model selection and
  model weighing for spode ensembles.
\newblock In {\em ECML}. 533--544.

\end{thebibliography}