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A.~G. Koru and H.~Liu, ``An investigation of the effect of module size on
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S.~K. Sundaram, J.~H. Hayes, and A.~Dekhtyar, ``Baselines in requirements
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G.~D. Boetticher, ``Nearest neighbor sampling for better defect prediction,''
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C.~Mair, M.~Shepperd, and M.~J{\o}rgensen, ``An analysis of data sets used to
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T.~Menzies, D.~Port, Z.~Chen, and J.~Hihn, ``Simple software cost analysis:
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Z.~Chen, T.~Menzies, D.~Port, and B.~Boehm, ``Feature subset selection can
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\bibitem{MENZIES2005-2}
T.~Menzies, D.~Port, Z.~Chen, J.~Hihn, and S.~Stukes, ``Validation methods for
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J.~H. Hayes, A.~Dekhtyar, and S.~Sundaram, ``Text mining for software
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\bibitem{HAYES2005-2}
J.~H. Hayes and A.~Dekhtyar, ``Humans in the traceability loop: can't live with
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\bibitem{JALALI2007}
O.~Jalali, T.~Menzies, D.~Baker, and J.~Hihn, ``Column pruning beats
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\bibitem{MA2007}
Y.~Ma and B.~Cukic, ``Adequate and precise evaluation of quality models in
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\bibitem{DEKHTYAR2007}
A.~Dekhtyar, J.~H. Hayes, and J.~Larsen, ``Make the most of your time: How
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\bibitem{LIU2007}
Y.~Liu, J.-F. Yao, G.~Williams, and G.~Adkins, ``Studying software metrics
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C.~Weiss, R.~Premraj, T.~Zimmermann, and A.~Zeller, ``How long will it take to
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\bibitem{MIZUNO2007}
O.~Mizuno and T.~Kikuno, ``Training on errors experiment to detect fault-prone
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\bibitem{GOKHALE2008}
S.~S. Gokhale and R.~Mullen, ``Software defect repair times: a multiplicative
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\bibitem{AZZEH2008}
M.~Azzeh, D.~Neagu, and P.~Cowling, ``Improving analogy software effort
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\bibitem{KORTE2008}
M.~Korte and D.~Port, ``Confidence in software cost estimation results based on
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\bibitem{MENZIES2008}
T.~Menzies, B.~Turhan, A.~Bener, G.~Gay, B.~Cukic, and Y.~Jiang, ``Implications
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\bibitem{JIANG2008}
Y.~Jiang, B.~Cuki, T.~Menzies, and N.~Bartlow, ``Comparing design and code
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\bibitem{MOSER2008}
R.~Moser, W.~Pedrycz, and G.~Succi, ``A comparative analysis of the efficiency
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G.~D. Boetticher and N.~Lokhandwala, ``Using correlation and accuracy for
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\bibitem{JALALI08}
O.~Jalali, T.~Menzies, and M.~Feather, ``Optimizing requirements decisions with
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J.~Li and G.~Ruhe, ``Multi-criteria decision analysis for customization of
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G.~A. Liebchen and M.~Shepperd, ``Data sets and data quality in software
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\bibitem{WATANABE08}
S.~Watanabe, H.~Kaiya, and K.~Kaijiri, ``Adapting a fault prediction model to
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\bibitem{BRAGA08}
P.~L. Braga, A.~L.~I. Oliveira, and S.~R.~L. Meira, ``A ga-based feature
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\bibitem{PORT2008}
D.~Port and M.~Korte, ``Comparative studies of the model evaluation criterions
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\bibitem{JIANG20082}
Y.~Jiang, B.~Cukic, and T.~Menzies, ``Can data transformation help in the
  detection of fault-prone modules?,'' in {\em DEFECTS '08: Proceedings of the
  2008 workshop on Defects in large software systems}, (New York, NY, USA),
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\bibitem{WEDEL2008}
M.~Wedel, U.~Jensen, and P.~G\"{o}hner, ``Mining software code repositories and
  bug databases using survival analysis models,'' in {\em ESEM '08: Proceedings
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  engineering and measurement}, (New York, NY, USA), pp.~282--284, ACM, 2008.

\bibitem{TOSUN2008}
A.~Tosun, B.~Turhan, and A.~Bener, ``Ensemble of software defect predictors: a
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\bibitem{KULTUR2008}
Y.~Kultur, B.~Turhan, and A.~B. Bener, ``Enna: software effort estimation using
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\bibitem{HATA08}
H.~Hata, O.~Mizuno, and T.~Kikuno, ``An extension of fault-prone filtering
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  repositories}, (New York, NY, USA), pp.~89--98, ACM, 2008.

\bibitem{KAMEI08}
Y.~Kamei, J.~Keung, A.~Monden, and K.-i. Matsumoto, ``An over-sampling method
  for analogy-based software effort estimation,'' in {\em ESEM '08: Proceedings
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\bibitem{YANG08}
Y.~Yang, M.~He, M.~Li, Q.~Wang, and B.~Boehm, ``Phase distribution of software
  development effort,'' in {\em ESEM '08: Proceedings of the Second ACM-IEEE
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\bibitem{RANA2008}
Z.~A. Rana, S.~Shamail, and M.~M. Awais, ``Towards a generic model for software
  quality prediction,'' in {\em WoSQ '08: Proceedings of the 6th international
  workshop on Software quality}, (New York, NY, USA), pp.~35--40, ACM, 2008.

\bibitem{HECKMAN2008}
S.~Heckman and L.~Williams, ``On establishing a benchmark for evaluating static
  analysis alert prioritization and classification techniques,'' in {\em ESEM
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\bibitem{BRODER2008}
A.~Broder, M.~Ciaramita, M.~Fontoura, E.~Gabrilovich, V.~Josifovski,
  D.~Metzler, V.~Murdock, and V.~Plachouras, ``To swing or not to swing:
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  ACM conference on Information and knowledge management}, (New York, NY, USA),
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\bibitem{HOLZ2008}
W.~Holz, R.~Premraj, T.~Zimmermann, and A.~Zeller, ``Predicting software
  metrics at design time,'' in {\em PROFES '08: Proceedings of the 9th
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\bibitem{ERDOGMUS2008}
H.~Erdogmus, ``The infamous ratio measure,'' {\em IEEE Software}, vol.~25,
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\bibitem{BOETTICHER2009}
G.~D. Boetticher, ``From software engineer to day trader in 3 easy steps: a
  comparison of software engineering (se) data mining with financial data
  mining,'' in {\em PROMISE '09: Proceedings of the 5th International
  Conference on Predictor Models in Software Engineering}, (New York, NY, USA),
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\bibitem{KITCHENHAM2009}
B.~Kitchenham and E.~Mendes, ``Why comparative effort prediction studies may be
  invalid,'' in {\em PROMISE '09: Proceedings of the 5th International
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\bibitem{GAY2009}
G.~Gay, T.~Menzies, B.~Cukic, and B.~Turhan, ``How to build repeatable
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\bibitem{TOSUN2009}
A.~Tosun, B.~Turhan, and A.~Bener, ``Validation of network measures as
  indicators of defective modules in software systems,'' in {\em PROMISE '09:
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\bibitem{TOSUN2009-3}
A.~Tosun, B.~Turhan, and A.~Bener, ``Practical considerations in deploying ai
  for defect prediction: a case study within the turkish telecommunication
  industry,'' in {\em PROMISE '09: Proceedings of the 5th International
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\bibitem{JIANG2009}
Y.~Jiang and B.~Cukic, ``Misclassification cost-sensitive fault prediction
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\bibitem{AZZEH2009}
M.~Azzeh, D.~Neagu, and P.~Cowling, ``Software effort estimation based on
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  Engineering}, (New York, NY, USA), pp.~1--10, ACM, 2009.

\bibitem{MENDE2009}
T.~Mende and R.~Koschke, ``Revisiting the evaluation of defect prediction
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\bibitem{WAGNER2009}
S.~Wagner, ``A bayesian network approach to assess and predict software quality
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\bibitem{FU09}
Y.~Fu, A.~G. Koru, Z.~Chen, and K.~El~Emam, ``A tree-based approach to preserve
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\bibitem{MENZIES2009}
T.~Menzies, O.~El-Rawas, J.~Hihn, and B.~Boehm, ``Can we build software faster
  and better and cheaper?,'' in {\em PROMISE '09: Proceedings of the 5th
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\bibitem{SARCIA2009-2}
S.~A. Sarcia', V.~R. Basili, and G.~Cantone, ``Using uncertainty as a model
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\bibitem{MORASCA2009}
S.~Morasca, ``Building statistically significant robust regression models in
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\bibitem{SARCIA2009}
S.~A. Sarcia, V.~R. Basili, and G.~Cantone, ``Scope error detection and
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C.~Bird, A.~Bachmann, E.~Aune, J.~Duffy, A.~Bernstein, V.~Filkov, and
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B.~Caglayan, A.~Bener, and S.~Koch, ``Merits of using repository metrics in
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A.~Tosun and A.~Bener, ``Reducing false alarms in software defect prediction by
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S.~Winkler, ``Trace retrieval for evolving artifacts,'' in {\em TEFSE '09:
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Y.~Singh, A.~Kaur, and R.~Malhotra, ``Application of support vector machine to
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C.~Catal, U.~Sevim, and B.~Diri, ``Software fault prediction of unlabeled
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S.~Moran, Y.~He, and K.~Liu, ``An empirical framework for automatically
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H.~Jia, F.~Shu, Y.~Yang, and Q.~Li, ``Data transformation and attribute subset
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A.~G. Koru, K.~E. Emam, D.~Zhang, H.~Liu, and D.~Mathew, ``Theory of relative
  defect proneness,'' {\em Empirical Softw. Engg.}, vol.~13, no.~5,
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Y.~Kultur, B.~Turhan, and A.~Bener, ``Ensemble of neural networks with
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Z.~A. Rana, M.~M. Awais, and S.~Shamail, ``An fis for early detection of defect
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\bibitem{TURHAN2009}
B.~Turhan, G.~Kocak, and A.~Bener, ``Data mining source code for locating
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\bibitem{SAMI2010}
A.~Sami and S.~M. Fakhrahmad, ``Design-level metrics estimation based on code
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R.~Malhotra, A.~Kaur, and G.~G. Singh, ``Application of machine learning
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P.~Fernandes, L.~Lopes, and D.~D.~A. Ruiz, ``The impact of random samples in
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\bibitem{GOKHALE2010}
S.~S. Gokhale and R.~E. Mullen, ``A multiplicative model of software defect
  repair times,'' {\em Empirical Softw. Engg.}, vol.~15, no.~3, pp.~296--319,
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M.~Azzeh, D.~Neagu, and P.~I. Cowling, ``Fuzzy grey relational analysis for
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\bibitem{BAKIR2010}
A.~Bak\ir, B.~Turhan, and A.~B. Bener, ``A new perspective on data homogeneity
  in software cost estimation: a study in the embedded systems domain,'' {\em
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